TY  - RPRT
TI  - Ultrasonic characterization of surface flaws using oblique angle backscattering technique
AU  - Chern, Engmin J.
AU  - Cantrell, John H., Jr.
PY  - 1987
UR  - https://ntrs.nasa.gov/citations/19900066370
ID  - 19900066370
ER  -