TY  - RPRT
TI  - Microhardness variations in II-VI semiconducting compounds as a function of composition
AU  - Andrews, R. N.
AU  - Walck, S. D.
AU  - Price, M. W.
AU  - Szofran, F. R.
AU  - Su, C.-H.
AU  - Lehoczky, S. L.
PY  - 1990
UR  - https://ntrs.nasa.gov/citations/19910037022
ID  - 19910037022
ER  -