TY  - RPRT
TI  - Single event induced transients in I/O devices - A characterization
AU  - Newberry, D. M.
AU  - Kaye, D. H.
AU  - Soli, G. A.
PY  - 1990
UR  - https://ntrs.nasa.gov/citations/19910038432
ID  - 19910038432
ER  -