@misc{indiciae09c54bcadeb9,
  title = {An analysis of defect densities found during software inspections},
  author = {Kelly, John C. and Sherif, Joseph S. and Hops, Jonathan},
  year = {1990},
  url = {https://ntrs.nasa.gov/citations/19920010193},
  note = {Source identifier: 19920010193}
}