TY  - RPRT
TI  - Microstructure characterization by angle-resolved scatter and comparison to measurements made by other techniques
AU  - Jacobson, R. D.
AU  - Wilson, S. R.
AU  - Al-Jumaily, G. A.
AU  - Mcneil, J. R.
AU  - Bennett, Jean M.
AU  - Mattsson, Lars
PY  - 1992
UR  - https://ntrs.nasa.gov/citations/19920051356
ID  - 19920051356
ER  -