@misc{indiciae04355bf15858,
  title = {Fatigue crack growth reliability by probabilistic finite elements},
  author = {Besterfield, Glen H. and Liu, Wing K. and Lawrence, Mark A. and Belytschko, Ted},
  year = {1991},
  url = {https://ntrs.nasa.gov/citations/19920054900},
  note = {Source identifier: 19920054900}
}