TY  - RPRT
TI  - Fatigue crack growth reliability by probabilistic finite elements
AU  - Besterfield, Glen H.
AU  - Liu, Wing K.
AU  - Lawrence, Mark A.
AU  - Belytschko, Ted
PY  - 1991
UR  - https://ntrs.nasa.gov/citations/19920054900
ID  - 19920054900
ER  -