@misc{indiciae6bfaea8a5f06,
  title = {Optoelectronic Instruments For Analysis Of Surface Defects},
  author = {Collins, J. David and Mueller, Robert P. and Davis, Richard M. and Gleman, Stuart M. and Hallberg, Carl G. and Thayer, Stephen W. and Thompson, David L. and Thompson, James E.},
  year = {1995},
  url = {https://ntrs.nasa.gov/citations/19950065248},
  note = {Source identifier: 19950065248}
}