TY  - RPRT
TI  - Defect characterization in ZnGeP2 by time-resolved photoluminescence
AU  - Dietz, N.
AU  - Wood, G.
AU  - Bachmann, K. J.
AU  - Busse, W.
AU  - Gumlich, H. E.
AU  - Ruderman, W.
AU  - Tsveybak, I.
PY  - 1995
UR  - https://ntrs.nasa.gov/citations/19960007725
ID  - 19960007725
ER  -