@misc{indiciae7ae8f0c32deb,
  title = {Using BEEM To Probe Strains In Semiconductors},
  author = {Bell, L. Douglas and Milliken, Autumn M. and Manion, Stephen J. and Kaiser, William J.},
  year = {1996},
  url = {https://ntrs.nasa.gov/citations/19960021837},
  note = {Source identifier: 19960021837}
}