TY  - RPRT
TI  - Using BEEM To Probe Strains In Semiconductors
AU  - Bell, L. Douglas
AU  - Milliken, Autumn M.
AU  - Manion, Stephen J.
AU  - Kaiser, William J.
PY  - 1996
UR  - https://ntrs.nasa.gov/citations/19960021837
ID  - 19960021837
ER  -