@misc{indiciaee2a29fa98bc8,
  title = {Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry},
  author = {Croke, E. T. and Wang, K. L. and Heyd, A. R. and Alterovitz, S. A. and Lee, C. H.},
  year = {1996},
  url = {https://ntrs.nasa.gov/citations/19960038261},
  note = {Source identifier: 19960038261}
}