TY  - RPRT
TI  - Characterization of Damage Accumulation in a C/SiC Composite at Elevated Temperatures
AU  - Telesman, Jack
AU  - Verrilli, Mike
AU  - Ghosn, Louis
AU  - Kantzos, Pete
PY  - 1997
UR  - https://ntrs.nasa.gov/citations/19970024966
ID  - 19970024966
ER  -