TY  - RPRT
TI  - Electron and Light Microscopy Techniques Suitable for Studying Fatigue Damage in a Crystallized Glass Ceramic
AU  - Harrell, Shelley
AU  - Zaretsky, Erwin V.
PY  - 1961
UR  - https://ntrs.nasa.gov/citations/19980236839
ID  - 19980236839
ER  -