@misc{indiciae451dcd93c9c5,
  title = {Study of Bulk and Elementary Screw Dislocation Assisted Reverse Breakdown in Low-Voltage (less than 250 V) 4H-SiC p(+)n Junction diodes: DC Properties - Part 1},
  author = {Neudeck, Philip G. and Huang, Wei and Dudley, Michael},
  year = {1998},
  url = {https://ntrs.nasa.gov/citations/19990004614},
  note = {Source identifier: 19990004614}
}