TY  - RPRT
TI  - Study of Bulk and Elementary Screw Dislocation Assisted Reverse Breakdown in Low-Voltage (less than 250 V) 4H-SiC p(+)n Junction diodes: DC Properties - Part 1
AU  - Neudeck, Philip G.
AU  - Huang, Wei
AU  - Dudley, Michael
PY  - 1998
UR  - https://ntrs.nasa.gov/citations/19990004614
ID  - 19990004614
ER  -