TY  - RPRT
TI  - Breakdown Degradation Associated with Elementary Screw Dislocations in 4H-SiC P(+)N Junction Rectifiers
AU  - Neudeck, P. G.
AU  - Huang, W.
AU  - Dudley, M.
PY  - 1998
UR  - https://ntrs.nasa.gov/citations/19990018454
ID  - 19990018454
ER  -