TY  - RPRT
TI  - Non-Micropipe Dislocations in 4H-SiC Devices: Electrical Properties and Device Technology Implications
AU  - Neudeck, Philip G.
AU  - Huang, Wei
AU  - Dudley, Michael
AU  - Fazi, Christian
PY  - 1998
UR  - https://ntrs.nasa.gov/citations/19990027952
ID  - 19990027952
ER  -