TY  - RPRT
TI  - Method and Apparatus for the Portable Identification of Material Thickness and Defects Using Spatially Controlled Heat Application
AU  - Cramer, K. Elliott
AU  - Winfree, William P.
PY  - 1999
UR  - https://ntrs.nasa.gov/citations/20000030735
ID  - 20000030735
ER  -