TY  - RPRT
TI  - 600 C Logic Gates Using Silicon Carbide JFET's
AU  - Neudeck, Philip G.
AU  - Beheim, Glenn M.
AU  - Salupo, Carl S.a
PY  - 2000
UR  - https://ntrs.nasa.gov/citations/20000033844
ID  - 20000033844
ER  -