TY  - RPRT
TI  - Displacement Damage in Bipolar Linear Integrated Circuits
AU  - Rax, B. G.
AU  - Johnston, A. H.
AU  - Miyahira, T.
PY  - 2000
UR  - https://ntrs.nasa.gov/citations/20000050467
ID  - 20000050467
ER  -