TY  - RPRT
TI  - Correlation Between Material Properties of Ferroelectric Thin Films and Design Parameters for Microwave Device Applications: Modeling Examples and Experimental Verification
AU  - Miranda, Felix A.
AU  - VanKeuls, Fred W.
AU  - Subramanyam, Guru
AU  - Mueller, Carl H.
AU  - Romanofsky, Robert R.
AU  - Rosado, Gerardo
PY  - 2000
UR  - https://ntrs.nasa.gov/citations/20000053481
ID  - 20000053481
ER  -