TY  - RPRT
TI  - A Strip-Yield Model for Predicting the Growth of Part-Through Cracks Under Cyclic Loading
AU  - Daniewicz, S. R.
AU  - Newman, J. C., Jr.
PY  - 2000
UR  - https://ntrs.nasa.gov/citations/20000063504
ID  - 20000063504
ER  -