@misc{indiciae0df75e670dcc,
  title = {On-Wafer Testing of Circuits Through 220 GHz},
  author = {Gaier, Todd and Samoska, Lorene and Oleson, Charles and Boll, Greg},
  year = {1999},
  url = {https://ntrs.nasa.gov/citations/20000064072},
  note = {Source identifier: 20000064072}
}