@misc{indiciaeb124afa73a30,
  title = {Fracture Tests of Etched Components Using a Focused Ion Beam Machine},
  author = {Kuhn, Jonathan, L. and Fettig, Rainer K. and Moseley, S. Harvey and Kutyrev, Alexander S. and Orloff, Jon and Powers, Edward I.},
  year = {2000},
  url = {https://ntrs.nasa.gov/citations/20000086611},
  note = {Source identifier: 20000086611}
}