@misc{indiciae1d4518317a6b,
  title = {Effect of Single-Electron Interface Trapping in Decanano MOSFETs: A 3D Atomistic Simulation Study},
  author = {Asenov, Asen and Balasubramaniam, R. and Brown, A. R. and Davies, J. H.},
  year = {2000},
  url = {https://ntrs.nasa.gov/citations/20010007222},
  note = {Source identifier: 20010007222}
}