TY  - RPRT
TI  - Effect of Single-Electron Interface Trapping in Decanano MOSFETs: A 3D Atomistic Simulation Study
AU  - Asenov, Asen
AU  - Balasubramaniam, R.
AU  - Brown, A. R.
AU  - Davies, J. H.
PY  - 2000
UR  - https://ntrs.nasa.gov/citations/20010007222
ID  - 20010007222
ER  -