TY  - RPRT
TI  - Efficient 3D 'Atomistic' Simulation Technique for Studying of Random Dopant Induced Threshold Voltage Lowering and Fluctuations in Decanano MOSFETs
AU  - Asenov, Asen
PY  - 1998
UR  - https://ntrs.nasa.gov/citations/20010007224
ID  - 20010007224
ER  -