TY  - RPRT
TI  - Creep of a Silicon Nitride Under Various Specimen/Loading Configurations
AU  - Choi, Sung R.
AU  - Powers, Lynn M.
AU  - Holland, Frederic A.
AU  - Gyekenyesi, John P.
AU  - Holland, F. A.
PY  - 2000
UR  - https://ntrs.nasa.gov/citations/20010061366
ID  - 20010061366
ER  -