@misc{indiciae7861a450aeb6,
  title = {Total Ionizing Dose Effects in MOS Oxides and Devices},
  author = {Oldham, Timothy R. and McLean, F. B.},
  year = {2003},
  url = {https://ntrs.nasa.gov/citations/20030032300},
  note = {Source identifier: 20030032300}
}