TY  - RPRT
TI  - Automated Guided-Wave Scanning Developed to Characterize Materials and Detect Defects
AU  - Martin, Richard E.
AU  - Gyekenyeski, Andrew L.
AU  - Roth, Don J.
PY  - 2004
UR  - https://ntrs.nasa.gov/citations/20050192414
ID  - 20050192414
ER  -