TY  - RPRT
TI  - Ferroelectric Material Application: Modeling Ferroelectric Field Effect Transistor Characteristics from Micro to Nano
AU  - MacLeod, Todd, C.
AU  - Ho, Fat Duen
PY  - 2006
UR  - https://ntrs.nasa.gov/citations/20060018359
ID  - 20060018359
ER  -