TY  - RPRT
TI  - Single Event Upset Behavior of CMOS Static RAM Cells
AU  - Lieneweg, Udo
AU  - Jeppson, Kjell O.
AU  - Buehler, Martin G.
PY  - 1993
UR  - https://ntrs.nasa.gov/citations/20060039117
ID  - 20060039117
ER  -