@misc{indiciaedce39729d142,
  title = {Ballistic-Electron-Emission Microscopy Techniques for Nanometer-scale Characterization of Interfaces},
  author = {Bell, L. D. and Grunthaner, F. J. and Hecht, M. H. and Manion, S. J. and Milliken, A. M. and Kaiser, W. J.},
  year = {1993},
  url = {https://ntrs.nasa.gov/citations/20060039253},
  note = {Source identifier: 20060039253}
}