TY  - RPRT
TI  - Ballistic-Electron-Emission Microscopy Techniques for Nanometer-scale Characterization of Interfaces
AU  - Bell, L. D.
AU  - Grunthaner, F. J.
AU  - Hecht, M. H.
AU  - Manion, S. J.
AU  - Milliken, A. M.
AU  - Kaiser, W. J.
PY  - 1993
UR  - https://ntrs.nasa.gov/citations/20060039253
ID  - 20060039253
ER  -