@misc{indiciaec51a518e2fe2,
  title = {Eddy Current System for Material Inspection and Flaw Visualization},
  author = {Bachnak, R. and King, S. and Maeger, W. and Nguyen, T.},
  year = {2007},
  url = {https://ntrs.nasa.gov/citations/20070020326},
  note = {Source identifier: 20070020326}
}