@misc{indiciaed7826e88108b,
  title = {Method for characterizing the upset response of CMOS circuits using alpha-particle sensitive test circuits},
  author = {Buehler, Martin G. and Blaes, Brent R. and Nixon, Robert H. and Soli, George A.},
  year = {1995},
  url = {https://ntrs.nasa.gov/citations/20080007429},
  note = {Source identifier: 20080007429}
}