TY  - RPRT
TI  - Method for characterizing the upset response of CMOS circuits using alpha-particle sensitive test circuits
AU  - Buehler, Martin G.
AU  - Blaes, Brent R.
AU  - Nixon, Robert H.
AU  - Soli, George A.
PY  - 1995
UR  - https://ntrs.nasa.gov/citations/20080007429
ID  - 20080007429
ER  -