TY  - RPRT
TI  - Radiation Testing, Characterization and Qualification Challenges for Modern Microelectronics and Photonics Devices and Technologies
AU  - LaBel, Kenneth A.
AU  - Cohn, Lewis M.
PY  - 2008
UR  - https://ntrs.nasa.gov/citations/20080044899
ID  - 20080044899
ER  -