@misc{indiciae939e21be5031,
  title = {Are Current SEE Test Procedures Adequate for Modern Devices and Electronics Technologies?},
  author = {LaBel, Kenneth A. and Cohn, Lewis M. and Ladbury, Ray},
  year = {2008},
  url = {https://ntrs.nasa.gov/citations/20080045417},
  note = {Source identifier: 20080045417}
}