TY  - RPRT
TI  - Are Current SEE Test Procedures Adequate for Modern Devices and Electronics Technologies?
AU  - LaBel, Kenneth A.
AU  - Cohn, Lewis M.
AU  - Ladbury, Ray
PY  - 2008
UR  - https://ntrs.nasa.gov/citations/20080045417
ID  - 20080045417
ER  -