@misc{indiciae8125bfe72223,
  title = {Single Event Test Methodologies and System Error Rate Analysis for Triple Modular Redundant Field Programmable Gate Arrays},
  author = {Allen, Gregory and Edmonds, Larry D. and Swift, Gary and Carmichael, Carl and Tseng, Chen Wei and Heldt, Kevin and Anderson, Scott Arlo and Coe, Michael},
  year = {2010},
  url = {https://ntrs.nasa.gov/citations/20110016076},
  note = {Source identifier: 20110016076}
}