@misc{indiciaeb9e7d1d111fa,
  title = {Radiation and Reliability Concerns for Modern Nonvolatile Memory Technology},
  author = {Oldham, Timothy R. and Friendlich, Mark R. and Kim, Hak S. and Berg, Melanie D. and LaBel, Kenneth A. and Buchner, S. P. and McMorrow, D. and Mavis, D. G. and Eaton, P. H. and Castillo, J.},
  year = {2011},
  url = {https://ntrs.nasa.gov/citations/20110023046},
  note = {Source identifier: 20110023046}
}