TY  - RPRT
TI  - Prognostics of Power Mosfets Under Thermal Stress Accelerated Aging Using Data-Driven and Model-Based Methodologies
AU  - Celaya, Jose
AU  - Saxena, Abhinav
AU  - Saha, Sankalita
AU  - Goebel, Kai F.
PY  - 2011
UR  - https://ntrs.nasa.gov/citations/20140010628
ID  - 20140010628
ER  -