TY  - RPRT
TI  - High-Throughput Processes and Structural Characterization of Single-Nanotube Based Devices for 3D Electronics
AU  - Kaul, A. B.
AU  - Megerian, K. G.
AU  - Baron, R. L.
AU  - Jennings, A. T.
AU  - Jang, D.
AU  - Greer, J. R.
PY  - 2011
UR  - https://ntrs.nasa.gov/citations/20150005994
ID  - 20150005994
ER  -