@misc{indiciae9789de841dc4,
  title = {Using Classical Reliability Models and Single Event Upset (SEU) Data to Determine Optimum Implementation Schemes for Triple Modular Redundancy (TMR) in SRAM-Based Field Programmable Gate Array (FPGA) Devices},
  author = {Berg, M. and Kim, H. and Phan, A. and Seidleck, C. and LaBel, K. and Pellish, J. and Campola, M.},
  year = {2015},
  url = {https://ntrs.nasa.gov/citations/20150018112},
  note = {Source identifier: 20150018112}
}