TY  - RPRT
TI  - Using Classical Reliability Models and Single Event Upset (SEU) Data to Determine Optimum Implementation Schemes for Triple Modular Redundancy (TMR) in SRAM-Based Field Programmable Gate Array (FPGA) Devices
AU  - Berg, M.
AU  - Kim, H.
AU  - Phan, A.
AU  - Seidleck, C.
AU  - LaBel, K.
AU  - Pellish, J.
AU  - Campola, M.
PY  - 2015
UR  - https://ntrs.nasa.gov/citations/20150018112
ID  - 20150018112
ER  -