TY  - RPRT
TI  - Characterization of System on a Chip (SoC) Single Event Upset (SEU) Responses Using SEU Data, Classical Reliability Models, and Space Environment Data
AU  - Berg, Melanie
AU  - Label, Kenneth
AU  - Campola, Michael
AU  - Xapsos, Michael
PY  - 2017
UR  - https://ntrs.nasa.gov/citations/20170004737
ID  - 20170004737
ER  -