TY  - RPRT
TI  - Single Event Effect Testing of the Micron MT46V128M8
AU  - Stansberry, Scott
AU  - Campola, Michael
AU  - Wilcox, Ted
AU  - Seidleck, Christina
AU  - Phan, Anthony
PY  - 2017
UR  - https://ntrs.nasa.gov/citations/20170009469
ID  - 20170009469
ER  -