@misc{indiciaea33ac90e142b,
  title = {Probing the SEB Sensitive Depth of a Power MOSFET Using a Two-Photon Absorption Laser Method},
  author = {Lauenstein, Jean-Marie and Liu, Sandra and Titus, Jeffrey L. and McMorrow, Dale and Casey, Megan C. and Buchner, Stephen P. and Warner, Jeffrey and Phan, Anthony M. and Topper, Alyson D. and Kim, Hak S. and LaBel, Kenneth A. and Yang, Becky and Zafrani, Max and Sherman, Phillip},
  year = {2011},
  url = {https://ntrs.nasa.gov/citations/20180001356},
  note = {Source identifier: 20180001356}
}